Photonics-based technologies rely on ever smaller devices and systems, which require accurate control of 3-D electromagnetic fields. Many microscopy techniques can map field characteristics by collecting radiation that is either coupled through or scattered off a subwavelength probe. What makes optical measurements challenging is that detecting radiation typically involves a photon-to-electron conversion. Moreover, guiding or scattering light at subwavelength scales involves interactions with metallic structures leading to thermal effects. We have proposed a way to overcome these challenges while maintaining the attributes of near-field scanning optical microscopy (NSOM). We showed that the mechanical action of light, i.e., the optically induced forces (OIF) exerted on a scanning probe, can be exploited for quantifying properties of electromagnetic fields.
© 2012 Optical Society of America
Vol. 8, Iss. 1 Virtual Journal for Biomedical Optics
Dana C. Kohlgraf-Owens, Sergey Sukhov, and Aristide Dogariu, "Near-Field Topography of Light," Optics & Photonics News 23(12), 39-39 (2012)
References are not available for this paper.
|Alert me when this paper is cited|
OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.