Image processing : Phase retrieval

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Optical encryption using multiple intensity samplings in the axial domain

• Abstract

• JOSA A, Vol. 30, Issue 5, pp. 806-812 (May 2013)
• Wen Chen, Xudong Chen, Arun Anand, Bahram Javidi

Common mode noise rejection properties of amplitude and phase noise in a heterodyne interferometer

• Abstract

• JOSA A, Vol. 30, Issue 5, pp. 941-947 (May 2013)
• Gerald Hechenblaikner

Two-step spatial phase-shifting radial shearing interferometery with circular gratings

• Abstract

• Optics Letters, Vol. 38, Issue 7, pp. 1116-1118 (April 2013)
• Jia Wang, Yang Song, Zhen-hua Li, An-zhi He

Single-step absorption and phase retrieval with polychromatic x rays using a spectral detector

• Abstract

• Optics Letters, Vol. 38, Issue 9, pp. 1461-1463 (May 2013)
• Doğa Gürsoy, Mini Das

Accelerated single-beam wavefront reconstruction techniques based on relaxation and multiresolution strategies

• Abstract

• Optics Letters, Vol. 38, Issue 10, pp. 1660-1662 (May 2013)
• Konstantinos Falaggis, Tomasz Kozacki, Malgorzata Kujawinska

Comparison of single distance phase retrieval algorithms by considering different object composition and the effect of statistical and structural noise

• Abstract
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• Optics Express, Vol. 21, Issue 6, pp. 7384-7399 (March 2013)
• R. C. Chen, L. Rigon, R. Longo

Resolution enhancement in digital holography by self-extrapolation of holograms

• Abstract
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• Optics Express, Vol. 21, Issue 6, pp. 7726-7733 (March 2013)
• Tatiana Latychevskaia, Hans-Werner Fink

Coherent x-ray zoom condenser lens for diffractive and scanning microscopy

• Abstract
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• Optics Express, Vol. 21, Issue 8, pp. 9267-9276 (April 2013)
• Takashi Kimura, Satoshi Matsuyama, Kazuto Yamauchi, Yoshinori Nishino

X-ray phase imaging with a laboratory source using selective reflection from a mirror

• Abstract
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• Optics Express, Vol. 21, Issue 8, pp. 9308-9314 (April 2013)
• Daniele Pelliccia, David M. Paganin

Total variation minimization approach in in-line x-ray phase-contrast tomography

• Abstract
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• Optics Express, Vol. 21, Issue 10, pp. 12185-12196 (May 2013)
• Alexander Kostenko, K. Joost Batenburg, Andrew King, S. Erik Offerman, Lucas J. van Vliet

Optical coherenscopy based on phase-space tomography

• Abstract
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• Optics Express, Vol. 21, Issue 11, pp. 13169-13183 (June 2013)
• Alejandro Cámara, José A. Rodrigo, Tatiana Alieva

Phase registration based on matching of phase distribution characteristics and its application in FDOCT

• Abstract
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• Optics Express, Vol. 21, Issue 11, pp. 13241-13255 (June 2013)
• Guozhong Liu, Zhehai Zhou, Ping Li

Natural method for three-dimensional range data compression

• Abstract

• Applied Optics, Vol. 52, Issue 9, pp. 1857-1863 (March 2013)
• Pan Ou, Song Zhang

Low-cost, phase-shifting mechanisms for Newton-type interferometers

• Abstract

• Applied Optics, Vol. 52, Issue 9, pp. 1913-1918 (March 2013)
• Joel Herrera, Esteban Luna, Luis Salas, Erika Sohn, Elfego Ruiz

Phase retrieval using nonlinear diversity

• Abstract

• Applied Optics, Vol. 52, Issue 10, pp. D92-D96 (April 2013)
• Chien-Hung Lu, Christopher Barsi, Matthew O. Williams, J. Nathan Kutz, Jason W. Fleischer

Three-bit representation of three-dimensional range data

• Abstract

• Applied Optics, Vol. 52, Issue 11, pp. 2286-2293 (April 2013)
• Nikolaus Karpinsky, Yajun Wang, Song Zhang

Experimental results of revised Misell algorithm for imaging through weakly scattering biological tissue

• Abstract

• Applied Optics, Vol. 52, Issue 11, pp. 2300-2305 (April 2013)
• Maya Aviv, Eran Gur, Zeev Zalevsky

Effects of missing low-frequency information on ptychographic and plane-wave coherent diffraction imaging

• Abstract

• Applied Optics, Vol. 52, Issue 11, pp. 2416-2427 (April 2013)
• Haigang Liu, Zijian Xu, Xiangzhi Zhang, Yanqing Wu, Zhi Guo, Renzhong Tai

Mitigating the effect of noise in the hybrid input–output method of phase retrieval

• Abstract

• Applied Optics, Vol. 52, Issue 13, pp. 3031-3037 (May 2013)
• Russell Trahan, David Hyland

Binary coded triangular fringes for 3-D surface-shape measurement

• Abstract

• Applied Optics, Vol. 52, Issue 15, pp. 3576-3582 (May 2013)
• Jorge L. Flores, García Torales, José A. Ferrari, Gastón Ayubi, Oscar Ed. Castillo, Matías Di Martino

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