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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 13, Iss. 6 — Jun. 1, 1974
  • pp: 1455–1459

Dynamics of Thin-Film Thermal Detectors in Infrared Imaging Systems. 1: Basic Equations and Fourier Analysis

U. Martens and F. Kneubühl  »View Author Affiliations


Applied Optics, Vol. 13, Issue 6, pp. 1455-1459 (1974)
http://dx.doi.org/10.1364/AO.13.001455


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Abstract

The complete Fourier analysis in space and time is performed for a three-dimensional model of thin-film thermal-imaging systems. The model includes heat losses by thermal radiation and by heat conduction within the film as well as into the adjacent medium. Dirac δ functions are used for the description of the specific heat and the thermal conductivity. The exact solutions of the basic heat equation are applied for a comparison of different types of the Panicon, a passive thermal imaging device. The relevant temperature response is illustrated in the Fourier space. The inclusion of the adjacent medium implies an occasional maximum of the response function in k space.

© 1974 Optical Society of America

History
Original Manuscript: October 1, 1973
Published: June 1, 1974

Citation
U. Martens and F. Kneubühl, "Dynamics of Thin-Film Thermal Detectors in Infrared Imaging Systems. 1: Basic Equations and Fourier Analysis," Appl. Opt. 13, 1455-1459 (1974)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-13-6-1455


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References

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