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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 13, Iss. 8 — Aug. 1, 1974
  • pp: 1807–1813

Instrumentation Optimization in Fourier Spectroscopy. 1: Far Infrared Beam Splitters

J. L. Deuzé and A. L. Fymat  »View Author Affiliations


Applied Optics, Vol. 13, Issue 8, pp. 1807-1813 (1974)
http://dx.doi.org/10.1364/AO.13.001807


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Abstract

Computations of the reflectivity, transmissivity, and efficiency properties for TE, TM, and T45° waves of far ir beam splitters (BS) and of the polarizations induced at both reflection and transmission are described. Effects of variations in the state of polarization, orientation, pointing accuracy, and wavelength of the incident light, as well as variations in refractive index and thickness of the BS, are discussed. These results apply directly to Fourier interferometer-spectrometers. They can be used for optimizing the performance of these instruments. They indicate, in particular, that some advantages may be gained by the use of incident polarized light (angle of polarization smaller than about 45° or negative elliptical polarization) or light of large incidence angle (larger than approximately 60°) or both. A novel method of inversion of experimental results to the end of determining the BS physical parameters is proposed. It makes use of the variations with incident light direction of the BS reflectivity, transmissivity, or efficiency curves.

© 1974 Optical Society of America

History
Original Manuscript: August 17, 1972
Revised Manuscript: January 11, 1974
Published: August 1, 1974

Citation
J. L. Deuzé and A. L. Fymat, "Instrumentation Optimization in Fourier Spectroscopy. 1: Far Infrared Beam Splitters," Appl. Opt. 13, 1807-1813 (1974)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-13-8-1807


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References

  1. O. S. Heavens, Optical Properties of Thin Solid Films (Butterworths, London, 1955).
  2. M. Born, E. Wolf, Principles of Optics (Pergamon, London, 1959).
  3. P. Rouard, Ann. Phys. 7, 291 (1937).
  4. A. W. Crook, J. Opt. Soc. Am. 38, 954 (1948). [CrossRef] [PubMed]
  5. A. Vašiček, J. Phys. 11, 342 (1950).
  6. F. Abelès, Ann. Phys. 3, 504 (1948).
  7. A. L. Fymat, Appl. Opt. 10, 2711 (1971). [CrossRef] [PubMed]
  8. A. L. Fymat, Appl. Opt. 11, 160 (1972). [CrossRef] [PubMed]
  9. A. L. Fymat, Appl. Opt. 10, 2499 (1971). [CrossRef] [PubMed]
  10. The difference between Jones’s and Abelès’s matrices may be noted. Abelès’s matrices relate both the reflected and the incident fields to the transmitted field separately for the TE and the TM modes. On the other hand, Jones’s matrices relate the reflected or the transmitted field to the incident field for both modes. The elements of the Jones’s matrices do not involve Fresnel’s coefficients, applicable only to a plane interface, but their generalized expressions to finitely thick films or Abelès’s coefficients.
  11. H. Anders, Thin Films in Optics (Focal Press, London, 1967).
  12. H. A. McLeod, Thin Film Optical Filters (Elsevier, New York, 1969).
  13. E. V. Loewenstein, A. Engelsrath, J. Phys. 28, C2-153 (1967).
  14. In the usual representation of the state of polarization of light in terms of the so-called Stokes intensity parameters, no information is provided on the phase of the light wave. On the other hand, the coherency representations, which make use of the (auto- and cross-) correlations Jij = 〈EiEj*〉, i, j = x, y, 〈…〉 = time-averaged quantity, * = complex conjugate, contain both amplitude and phase information and provide therefore a more appropriate description of polarization for the Fourier spectroscopic method. Among these representations, the polarization coherency matrix (PCM) is the most convenient one because, like the instrumental Jones’s matrix, it is expressed by a two-by-two matrix. The elements of the PCM are the Jij’s.

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