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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 13, Iss. 8 — Aug. 1, 1974
  • pp: 1956–1958

Sensitive Technique for Measuring Differences in Reflectivity

W. R. Scott, L. Muldawer, and M. A. Graber  »View Author Affiliations


Applied Optics, Vol. 13, Issue 8, pp. 1956-1958 (1974)
http://dx.doi.org/10.1364/AO.13.001956


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Abstract

A new technique for measuring reflectivity differences between two samples is reported. An electrically driven tuning fork is used to place the two samples alternately in the beam of a reflectometer, and a lock-in amplifier is used for detection of the difference signal. Advantages of this system include short deadtime, vacuum operation, and extremely high Q. The sensitivity is such that changes in reflectivity of the order of 0.001% can be observed.

© 1974 Optical Society of America

History
Original Manuscript: January 21, 1974
Published: August 1, 1974

Citation
W. R. Scott, L. Muldawer, and M. A. Graber, "Sensitive Technique for Measuring Differences in Reflectivity," Appl. Opt. 13, 1956-1958 (1974)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-13-8-1956


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References

  1. D. Beaglehole, Applied Optics 1, 11 (1968).
  2. J. A. Holbrook, R. E. Hummel, Rev. Sci. Instrum. 44, 463 (1973). [CrossRef]
  3. S. N. Jasperson, S. E. Schnatterly, Phys. Rev. 188, 759 (1969). [CrossRef]
  4. W. R. Scott, L. Muldawer, Bull. Am. Phys. Soc. 16, 82 (1971).
  5. M. Cardona, Modulation Spectroscopy (Academic Press, New York, 1969), p. 99.
  6. R. E. Hummel, J. B. Andrews, Phys. Rev. B8, 2449 (1973).
  7. W. R. Scott, L. Muldawer, Phys. Rev. B9, 1115 (1974).

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