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Applied Optics

Applied Optics


  • Vol. 21, Iss. 12 — Jun. 15, 1982
  • pp: 2129–2132

Silicon photodiode absolute spectral response self-calibration using a filtered tungsten source

Carroll G. Hughes, III  »View Author Affiliations

Applied Optics, Vol. 21, Issue 12, pp. 2129-2132 (1982)

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A method of extending the silicon photodiode absolute spectral response self-calibration techniques to nonlaser wavelengths using a tungsten source filtered with narrow well-characterized interference filters is described. Results are presented for comparisons of two photodiodes self-calibrated with a laser source and for comparisons of two photodiodes self-calibrated with the filtered tungsten source. Results of the photodiode self-calibration with filtered tungsten radiation were verified by comparisons with a spectrally flat pyroelectric radiometer calibrated in terms of the self-calibration of photodiodes at the He–Ne laser wavelength. These data show that the method can be used to establish an absolute spectral response scale, from 0.400 to 0.800 μm, with an uncertainty of better than ±1.0%. The scale realized by the self-calibration method is independent of lamp standards and blackbody detectors. The method can be used in any moderately equipped laboratory.

© 1982 Optical Society of America

Original Manuscript: February 16, 1982
Published: June 15, 1982

Carroll G. Hughes, "Silicon photodiode absolute spectral response self-calibration using a filtered tungsten source," Appl. Opt. 21, 2129-2132 (1982)

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  1. J. Geist, Appl. Opt. 18, 760 (1979). [CrossRef] [PubMed]
  2. E. F. Zalewski, J. Geist, Appl. Opt. 19, 1214 (1980). [CrossRef] [PubMed]
  3. References to specific manufacturers do not constitute endorsement but are given to describe adequately the experiment.
  4. J. B. Fowler, M. A. Lind, E. F. Zalewski, Natl. Bur. Stand. U.S. Tech. Note 987 (1979).

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