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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 51, Iss. 12 — Apr. 20, 2012
  • pp: 2057–2061

Double slit interferometry to measure the EUV refractive indices of solids using high harmonics

Lucy A. Wilson, Andrew K. Rossall, Erik Wagenaars, Cephise M. Cacho, Emma Springate, I. C. Edmond Turcu, and Greg J. Tallents  »View Author Affiliations


Applied Optics, Vol. 51, Issue 12, pp. 2057-2061 (2012)
http://dx.doi.org/10.1364/AO.51.002057


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Abstract

Accurate values of the extreme ultraviolet (EUV) optical properties of materials are required to make EUV optics such as filters and multilayer mirrors. The optical properties of aluminum studied in this report are required, in particular, as aluminum is used as an EUV filter material. The complex refractive index of solid aluminum and the imaginary part of the refractive index of solid iron between 17 eV and 39 eV have been measured using EUV harmonics produced from an 800 nm laser focused to 1014Wcm2 in an argon gas jet impinging on a double slit interferometer.

© 2012 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.7000) Instrumentation, measurement, and metrology : Transmission
(260.6048) Physical optics : Soft x-rays

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: November 28, 2011
Revised Manuscript: January 27, 2012
Manuscript Accepted: February 6, 2012
Published: April 18, 2012

Citation
Lucy A. Wilson, Andrew K. Rossall, Erik Wagenaars, Cephise M. Cacho, Emma Springate, I. C. Edmond Turcu, and Greg J. Tallents, "Double slit interferometry to measure the EUV refractive indices of solids using high harmonics," Appl. Opt. 51, 2057-2061 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-12-2057

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