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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 13 — May. 1, 2012
  • pp: 2419–2428

Flexible structured-light-based three-dimensional profile reconstruction method considering lens projection-imaging distortion

Suodong Ma, Rihong Zhu, Chenggen Quan, Lei Chen, Cho Jui Tay, and Bo Li  »View Author Affiliations


Applied Optics, Vol. 51, Issue 13, pp. 2419-2428 (2012)
http://dx.doi.org/10.1364/AO.51.002419


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Abstract

Structured-light profilometry is a powerful tool to reconstruct the three-dimensional (3D) profile of an object. Accurate profile acquisition is often hindered by not only the nonlinear response (i.e., gamma effect) of electronic devices but also the projection-imaging distortion of lens used in the system. In this paper, a flexible 3D profile reconstruction method based on a nonlinear iterative optimization is proposed to correct the errors caused by the lens distortion. It can be easily extended to measurements for which a more complex projection-imaging distortion model is required. Experimental work shows that the root-mean-square (RMS) error is reduced by eight times and highly accurate results with errors of less than 1‰ can be achieved by the proposed method.

© 2012 Optical Society of America

OCIS Codes
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(150.6910) Machine vision : Three-dimensional sensing

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: December 8, 2011
Revised Manuscript: January 25, 2012
Manuscript Accepted: February 13, 2012
Published: May 1, 2012

Citation
Suodong Ma, Rihong Zhu, Chenggen Quan, Lei Chen, Cho Jui Tay, and Bo Li, "Flexible structured-light-based three-dimensional profile reconstruction method considering lens projection-imaging distortion," Appl. Opt. 51, 2419-2428 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-13-2419

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