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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 38, Iss. 3 — Feb. 1, 2013
  • pp: 365–367

Monitoring of vapor uptake by refractive index and thickness measurements in thin films

Weijian Chen, John E. Saunders, Jack A. Barnes, Scott S.-H. Yam, and Hans-Peter Loock  »View Author Affiliations


Optics Letters, Vol. 38, Issue 3, pp. 365-367 (2013)
http://dx.doi.org/10.1364/OL.38.000365


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Abstract

We report a method for real-time monitoring of vapor uptake by simultaneous detection of the refractive index, n, and thickness, d, of thin transparent films with a precision of δn=104 and δd<100nm. The setup combines total internal reflection (Abbé) refractometry with an interferometric imaging method. A fast Fourier transform and phase fitting method is applied for accurate and independent determination of refractive indices and thicknesses. While the uptake of acetone vapor by polydimethylsiloxane is investigated, the system is also suited for characterization of other solid and liquid films.

© 2013 Optical Society of America

OCIS Codes
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5700) Instrumentation, measurement, and metrology : Reflection

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: October 30, 2012
Revised Manuscript: December 21, 2012
Manuscript Accepted: December 23, 2012
Published: January 29, 2013

Citation
Weijian Chen, John E. Saunders, Jack A. Barnes, Scott S.-H. Yam, and Hans-Peter Loock, "Monitoring of vapor uptake by refractive index and thickness measurements in thin films," Opt. Lett. 38, 365-367 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-3-365

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