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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Xi-Cheng Zhang
  • Vol. 39, Iss. 11 — Jun. 1, 2014
  • pp: 3173–3176

Double metal subwavelength slit arrays interference to measure the orbital angular momentum and the polarization of light

Hailong Zhou, Siqi Yan, Jianji Dong, and Xinliang Zhang  »View Author Affiliations


Optics Letters, Vol. 39, Issue 11, pp. 3173-3176 (2014)
http://dx.doi.org/10.1364/OL.39.003173


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Abstract

We put forward a double-slit interference device based on two metal subwavelength slit arrays to measure the orbital angular momentum (OAM) and the polarization of beams simultaneously. The subwavelength slit serves as a localized spatial polarizer, and each slit array can be regarded as a wide diffraction-slit. When an OAM beam is normally incident upon the two slit arrays, the interference fringes twist, and the displacement depends on the topological charge of OAM beams. We present a detailed theoretical analysis of this measurement model. This model does not need additional reference light and is a linear model.

© 2014 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(050.4865) Diffraction and gratings : Optical vortices
(310.6628) Thin films : Subwavelength structures, nanostructures

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: March 19, 2014
Revised Manuscript: April 23, 2014
Manuscript Accepted: April 25, 2014
Published: May 23, 2014

Citation
Hailong Zhou, Siqi Yan, Jianji Dong, and Xinliang Zhang, "Double metal subwavelength slit arrays interference to measure the orbital angular momentum and the polarization of light," Opt. Lett. 39, 3173-3176 (2014)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-39-11-3173

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