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Optics Letters

Optics Letters


  • Editor: Xi-Cheng Zhang
  • Vol. 39, Iss. 11 — Jun. 1, 2014
  • pp: 3298–3300

Microring-based ratio-metric wavelength monitor on silicon

Bing Yang, Ao Shen, Chen Qiu, Ting Hu, Longzhi Yang, Hui Yu, Xiaoqing Jiang, Yubo Li, Yinlei Hao, and Jianyi Yang  »View Author Affiliations

Optics Letters, Vol. 39, Issue 11, pp. 3298-3300 (2014)

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An integrated dual-ring ratio-metric wavelength monitor (DR-RMWM) with ultra-high wavelength resolution and compact size is demonstrated. Two microrings are used as the edge filters and designed to achieve an “X-type” spectral response in a particular wavelength range. It is fabricated with the CMOS-compatible fabrication process on the silicon-on-insulator. The measured wavelength resolution is 5 pm in a 1.2 nm wide wavelength range. By tuning the resonant wavelength thermally, the functional wavelength range can be shifted. The DR-RMWM can find applications in wavelength monitoring systems, especially the on-chip systems.

© 2014 Optical Society of America

OCIS Codes
(130.0130) Integrated optics : Integrated optics
(130.1750) Integrated optics : Components
(130.3120) Integrated optics : Integrated optics devices
(230.7390) Optical devices : Waveguides, planar

ToC Category:
Integrated Optics

Original Manuscript: February 24, 2014
Revised Manuscript: April 12, 2014
Manuscript Accepted: April 12, 2014
Published: May 29, 2014

Bing Yang, Ao Shen, Chen Qiu, Ting Hu, Longzhi Yang, Hui Yu, Xiaoqing Jiang, Yubo Li, Yinlei Hao, and Jianyi Yang, "Microring-based ratio-metric wavelength monitor on silicon," Opt. Lett. 39, 3298-3300 (2014)

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