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Optics Letters

Optics Letters


  • Editor: Xi-Cheng Zhang
  • Vol. 39, Iss. 11 — Jun. 1, 2014
  • pp: 3308–3311

Scaling in light scattering by sharp conical metal tips

Anders Pors, Khachatur V. Nerkararyan, and Sergey I. Bozhevolnyi  »View Author Affiliations

Optics Letters, Vol. 39, Issue 11, pp. 3308-3311 (2014)

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Using the electrostatic approximation, we analyze electromagnetic fields scattered by sharp conical metal tips, which are illuminated with light polarized along the tip axis. We establish scaling relations for the scattered field amplitude and phase, and verify the validity with numerical simulations. Analytic expressions for the wavelength at which the scattered field near the tip changes its direction and for the field decay near the tip extremity are obtained, relating these characteristics to the cone angle and metal permittivity. The results obtained have important implications for various tip-enhanced phenomena, ranging from Raman and scattering near-field imaging to photoemission spectroscopy and nano-optical trapping.

© 2014 Optical Society of America

OCIS Codes
(260.3910) Physical optics : Metal optics
(180.4243) Microscopy : Near-field microscopy
(350.4855) Other areas of optics : Optical tweezers or optical manipulation
(250.5403) Optoelectronics : Plasmonics

ToC Category:

Original Manuscript: March 17, 2014
Revised Manuscript: April 29, 2014
Manuscript Accepted: April 29, 2014
Published: May 29, 2014

Anders Pors, Khachatur V. Nerkararyan, and Sergey I. Bozhevolnyi, "Scaling in light scattering by sharp conical metal tips," Opt. Lett. 39, 3308-3311 (2014)

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