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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 14 — May. 10, 2014
  • pp: 3004–3009

Temperature dependence of laser-induced micro/nanostructures for femtosecond laser irradiation of silicon

Guoliang Deng, Guoying Feng, Kui Liu, and Shouhuan Zhou  »View Author Affiliations


Applied Optics, Vol. 53, Issue 14, pp. 3004-3009 (2014)
http://dx.doi.org/10.1364/AO.53.003004


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Abstract

The temperature dependence (from 25°C to 350°C) of laser-induced micro/nanostructures for multiple linearly polarized femtosecond laser pulse (pulse duration τ=35fs, wavelength λ=800nm) irradiation of silicon in air is studied experimentally. Distinct micro/nanostructures are fabricated at elevated temperature. Low spatial frequency, laser-induced periodic ripple structures (LSFL), which are perpendicular to the polarization of the laser beam, are formed at all temperatures. Micrometer-size grooves, which are oriented perpendicular to the LSFL ripples, have been observed in the central part of the irradiated area above 150°C. The threshold to fabricate the LSFL ripples goes from 1.65 to 2kJ/m2 while the temperature of the substrate increases from 25°C to 350°C. The possible mechanism of the temperature dependence of the micro/nanostructure generation is also discussed. These results demonstrate that temperature is an important parameter to be tuned to tailor the micro/nanostructure fabrication.

© 2014 Optical Society of America

OCIS Codes
(140.3390) Lasers and laser optics : Laser materials processing
(160.6000) Materials : Semiconductor materials
(050.6624) Diffraction and gratings : Subwavelength structures

ToC Category:
Lasers and Laser Optics

History
Original Manuscript: December 6, 2013
Revised Manuscript: April 1, 2014
Manuscript Accepted: April 1, 2014
Published: May 5, 2014

Citation
Guoliang Deng, Guoying Feng, Kui Liu, and Shouhuan Zhou, "Temperature dependence of laser-induced micro/nanostructures for femtosecond laser irradiation of silicon," Appl. Opt. 53, 3004-3009 (2014)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-53-14-3004


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